Summary
A groundbreaking microbeam synchrotron X-ray fluorescence (µ-SXRF) beamline at the Siam Photon Laboratory has demonstrated its capability to distinguish elemental distributions on ancient pottery from Ban Chiang. This advancement leverages synchrotron radiation focused to micrometer precision using an X-ray capillary half-lens, enabling non-destructive analysis of cultural heritage materials. The beamline, initially designed for deep X-ray lithography, was adapted for µ-SXRF and synchrotron X-ray powder diffraction (SXPD) through strategic modifications, including the installation of a Si(111) crystal and specialized end-stations. Performance testing on Ban Chiang pottery confirmed the technique's ability to resolve elemental surface profiles with high precision, marking a significant leap in archaeological material analysis.
Citation
Tancharakorn, S., Tanthanuch, W., Kamonsutthipaijit, N., Wongprachanukul, N., Sophon, M., Chaichuay, S., Uthaisar, C., & Yimnirun, R. (2012). The first microbeam synchrotron X-ray fluorescence beamline at the Siam Photon Laboratory. Journal of Synchrotron Radiation, 19(4), 536–540. https://doi.org/10.1107/s090904951201789x